Surface Science Western has a collection of metrological tools to measure, quantify, and analyze surface morphology of samples at various length scales, from nanometers to centimeters. Some of these specialty techniques include atomic force microscopy (AFM), stylus profilometry, confocal scanning laser microscopy (CLSM), and the recently acquired optical coordinate measuring machine (CMM). Each technique has unique capabilities and strengths, allowing SSW scientists to customize our scientific investigations to correctly produce the measurements that you require. To help you determine which technique best suits your project, Dr. Heng-Yong Nie, SSW’s resident metrology expert, has created an introductory technical note to metrological techniques, which includes information on instrument selection, analysis requirements, and outcomes based on the surface finish. Please see the technical note here:
Surface Science Western 
