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Analysis Request
(519) 661-2173
About Us
Our Team
ISO 17025:2017 Certification
FAQ
Analysis Request
Industrial Solutions
Aerospace
Automotive
Defence
Electronics
Energy and Nuclear Power
Environmental
Medical/Health
Mining and Mineralogy
Analytical Services
Atomic Force Microscopy (AFM)
Auger Electron Spectroscopy (AES)
Confocal Laser Scanning Microscopy (CLSM)
Contact Angle
Corrosion and Electrochemistry
Differential Scanning Calorimetry (DSC)
Dynamic SIMS (D-SIMS)
Fourier Transform Infrared Spectroscopy (FTIR)
Laser Raman Spectroscopy
Microhardness Testing
Optical Microscopy
SEM/EDX
Sample Preparation and Processing
Surface Profilometry
Thermogravimetric Analysis (TGA)
Time-of-Flight SIMS (ToF-SIMS)
Tribological Testing
UV-Vis Spectroscopy
Weathering Chambers
X-ray Photoelectron Spectroscopy (XPS)
X-ray Diffraction (XRD)
X-Ray Micro-Computed Tomography (Micro-CT)
Partner Facilities
Training and Courses
Sample Submission
Research
Research Highlights
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Patents
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News
Contact
Deportment of gold in discharge samples from AC-POX/CIL circuits
Deliverables:
Evaluation of refractory gold in residual (unoxidized) sulphides using quantitative D-SIMS analysis:
Quantification of sub-microscopic gold content in sulphides of different morphological types
Quantification of the arsenic content
Mapping of the gold and arsenic distribution (optional)
Evaluation of gold trapped in primary FeO
x
and oxidation products by D-SIMS:
Quantification of sub-microscopic gold content in the iron oxides
Quantification of the arsenic content
Mapping of the gold and arsenic distribution (optional)
ToF-SIMS analysis of exposed gold with impermeable coatings: Hg, Ag, Cu, phosphates, arsenides, carbonates,
et cetera
.
Written report